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W.M.Keck Nanostructures Laboratory, UMass - Amherst
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DI Nanoscope-IV Multimode AFM:

The Multimode model AFM uses sample scanning to obtain topographic and phase imaging of the surface and hence the sample size is limited to ~ 1 cm2. This equipment can image samples using the Contact mode, Tapping mode and Imaging under liquid. In addition this equipment is capable of imaging under variable temperature from room temperature up to 250°C.

W.M.Keck Nanostructures Laboratory @ University of Massachusetts, Amherst