MORPHOLOGY
Thomas P. Russell, Coordinator

X-Ray Diffraction and Scattering Laboratory
Alan J. Waddon, Director

The X-Ray Diffraction and Scattering Facility is well equipped for experiments in both the wide and small angle regimes. A diffractometer with Bragg-Brentano optics can be used in either reflection or transmission modes.

In the transmission mode, a four-circle attachment is available which allows full textural analysis. In the reflection mode, small angle reflectivity measurements from thin films are possible. For photographic recording of wide angle diffraction, Debye-Scherrer powder cameras and a range of Statton flat-plate cameras are available. The Statton cameras, which are particularly well suited for the recording of the anisotropic scatter from fibers, are also equipped with hot stages that allow research on phase transitions of materials.

Transmission diffraction experiments can also be performed in either the static or time resolved mode utilizing a Siemen's, two dimensional, multiwire detector. While this detector provides an exceptional increase in the siganl-to-noise ratio for isotropic materials, due to the circular averaging capabilities, the area detector is ideally suited for use on anisotropic specimens. A similar detector has also been installed on a pinhole small angle camera which offers similar capabilities for larger scale morphological features. This detector is used in combination with a high intensity rotating anode generator.