The Surface Analysis Facility is directed by Jack Hirsch. This facility is available for contract work as needed by companies and other institutions. The facility provides training and consultation for researchers interested in surface composition and /or structure. This battery of instrumentation allows one to gain information about the elemental analysis and chemical composition of a surface. Such techniques for surface characterization are particularly important in adhesive and lubricant development, in printing and coatings research, the electronics industry, and for biomedical implant technology development.
- Physical Electronics, Inc. USA (PHI) Quantum 2000 Scanning ESCA microprobe with variable spot, scanning, imaging, and sputtering capabilities
- Ramé-Hart, Inc. NRL Contact Angle Telegoniometers, Model 100
- JEOL Neoscope bench top SEM
- Gaertner LSE Stokes Ellipsometer.